Full-wafer Inspection Without Stitching

32k Line Scan Imaging For High-throughput Semiconductor Inspection

Reduced system complexity and reliable defect detection.

Talk To Wafer Inspection Expert

Why 32K Matters In Wafer Production

Achieve higher resolution or larger inspection coverage without increasing camera count, optical complexity, or calibration effort.

Higher Resolution At The Same Field Of View

Increase inspection precision from 20 µm to 10 µm resolution while maintaining the same field of view. Detect smaller defects without redesigning the optical setup.

Larger Wafer Coverage Without Additional Cameras

Expand inspection coverage from 150 mm to 300 mm with a single 32K line scan camera. Enable seamless full-wafer imaging with fewer stitching zones.

Reuse Existing 16K Optical Setups

Accelerate system upgrades without redesigning the complete optical architecture: Standard 16K optics remain compatible with the 32K camera platform.

Reduce Multi-Camera System Complexity

Simplify system integration with a validated subsystem combining camera, optics, illumination, and frame grabber. Reduce engineering effort and accelerate deployment in semiconductor inspection environments.

Optimized For Semiconductor Production Environments

High-speed line scan imaging optimized for throughput, inspection consistency, and reflective wafer surfaces.

Stable Inspection Consistency

Maintain consistent imaging performance across large wafer areas with seamless single-pass acquisition.

Reliable Defect Visibility

Detect particles, scratches, and macro defects on reflective wafer surfaces with high-uniformity illumination.

Inspection Throughput

Scan full wafers in under 10 seconds to support high-throughput semiconductor inspection workflows.

From Standard Components To Fully Integrated Inspection Systems

From standalone 32K cameras to fully integrated inspection systems, our line scan portfolio supports different levels of semiconductor inspection integration. Combine allPIXA evo 32K camera, optics, illumination, frame grabber, and software as a validated subsystem or deploy a pre-calibrated OEM solution tailored to your production environment.

allPIXA evo 32k

allPIXA evo 32k features a CMOS single-line sensor with 32,768 pixels and can reach line rates up to 73 kHz (Mono).

CoaXPress CXP-12 with 4 connections
Output of 32768 pixels Mono
Precise multi-camera synchronization
Fully GenICam and GigE Vision compliant

Framegrabber Coaxlink Quad CXP-12 Value

Ensures deterministic data transfer and synchronization for high-throughput inspection environments, supporting stable real-time wafer imaging.

Illumination

Complete wafer surface inspection at every production stage requires high-intensity illumination to detect macro defects, foreign particles, and coating flaws - often combining bright- and dark-field geometries in a single system.

Are You Ready For The Next Step?

Get in touch with us

Contact expert

Contact Our Experts Now!

First Name

Last Name

Email

Phone

Company

Country

Tell us about your application:

We hate spam as much as you. Please prove that you're not a spambot. What's 6+3?

TKH Company

Selected Product

Lead Source Detail

SPAM

*mandatory field

Your data will be processed in accordance with the Privacy Policy.