See through silicon.

Reveal the unseen, catch defects sooner.

Visible light leaves blind spots in semiconductor inspection. Short wave infrared closes them - exposing subsurface defects, material differences, and alignment features across your line. Our end-to-end SWIR portfolio integrates from lab to in line AOI, helping you catch issues earlier, protect yield, and ship with confidence.

Discover our SWIR camera portfolio

Application Examples in Semiconductor Production and Inspection

From bare wafers to final delivery, visual inspection is essential at every stage. These are typical areas of application where high-resolution imaging and customized lighting make all the difference.

Semicon, Electronics & Display inspection

Bare and patterned Wafer Manufacturing

Detection of microcracks and subsurface damage in wafers
Through-wafer imaging of internal and front-side structures (e.g., for alignment)

Advanced Packaging

Detection of hidden defects in bonded or stacked structures
Inspection of die attach quality and underfill voids

Wafer or Die Bonding

Precise alignment of marks through silicon for wafer to wafer and die to wafer bonding.
Detection of voids, particles, bubbles, and delamination after bonding.

Diced Die Sorting and Inspection

Identification of microcracks from sawing or laser dicing, including subsurface and edge damage
Die quality grading prior to packaging

Why SWIR?

See more. Achieve more.

Infrared radiation lies between visible light and microwaves on the electromagnetic spectrum, with short-wave infrared (SWIR) covering wavelengths from 0.9 to 2.5 μm. Although SWIR radiation is not visible to the human eye, it interacts with objects like visible light, enabling cameras to "see" through various materials and in challenging environments.

Indium Gallium Arsenide (InGaAs) based sensors are very popular to detect light in the SWIR range. They enable you to:

see through silicon and many packaging materials at SWIR wavelengths
differentiate coatings, adhesives, and contamination that look identical in visible light
see in low-light, dust, or haze
provide high image quality enhanced by our uniformity correction, low noise, and the right cooling for longer exposures.

Our SWIR Camera Portfolio

Allied Vision provides one of the most-comprehensive SWIR camera portfolios on the market supporting area- and line-scan SWIR sensors. Select from single boardlevel options to housed models with compact form factor and up to scientific grade solutions with strong sensor cooling and sensitivity up to 2.2µm.

Click on the camera series and find out more!

Goldeye/Goldeye Pro - Excelence in SWIR Imaging

Compact and robust fanless industrial design (55 mm x 55 mm) ensuring silent, maintenance-free 24/7 operation
High-resolution IMX99x Sony SenSWIR InGaAs sensors with integrated TEC1 cooling and support of highest possible sensor resolutions
5 GigE interface for efficient data transmission with cost-effective, easy-to-integrate network connectivity
Advanced image correction features including Non-Uniformity and Defect Pixel Correction applied instantaneously (from image to image)
Superior thermal stability for outstanding and reproducible image quality ensuring best-in-class performance for IMX992/993 sensors

Goldeye - Versatile High-performance SWIR Platfrom

Two housing designs: compact industrial (55mm x 55mm x 78mm) and advanced scientific (90 mm x 90 mm x 80 mm) for demanding applications
Support of numerous InGaAs sensors with TEC1 or TEC2 cooling including IMX990/991 Sony SenSWIR sensors
Models with strong sensor cooling down to -30°C for long exposure times or eXtended SWIR sensitivity up to 2,200nm
Standard compliant GigE Vision and Camera Link interfaces
Advanced image correction features including Non-Uniformity, Defect Pixel, and Background Correction. NUC and DPC sets are applied instantaneously (from image to image).
Outstanding image quality with high dynamic range (up to >70dB)

FXO - SWIR Imaging with Highest Throughput

World’s fastest high-resolution SWIR camera series with compact industrial housing design (50 mm x 50 mm)
External fan for reliable sensor temperature stabilization and reproducible imaging results
Support of IMX990/992/993 Sony SenSWIR sensors optionally with thermo-electric cooling (TEC1)
CoaXPress-12 interface for lowest latency and highest speed
10 GigE interface for highest throughput via Ethernet Networks and a simplified system integration
Advanced image correction features including Non-Uniformity Correction, Defect Pixel, and Shading Correction. with dynamically loaded setting-dependent correction sets
4-channel strobe controller supporting complex multi-light illumination scenarios
Unmatched frame rates for time-critical high-speed inspection and sorting applications

svs seriesimg fxo titelbild serie id77 800

Alvium - Compact, Flexible, and Affordable SWIR

Ultra-compact form factor (29mm x 29mm), lightweight, energy-efficient, and cost-effective (SWaP+C optimized)
High modularity including board-level versions (Flex & Frame) and various mount options
Support of all TEC-less IMX99x SenSWIR sensors including taped and removed cover glass options
Multiple standardized interface options: USB3, GigE, 5GigE, and CSI-2(MIPI) including range extenders for FPD-Link III and GMSL2
Extended feature set including sequencer, convolution filters, and lens shading compensation
Maximum design flexibility and cost-efficiency for embedded and OEM SWIR applications

exo - Accessible Industrial SWIR Imaging

Compact and robust industrial design (50mm x 50mm) for reliable operation
TEC-less IMX990/991 Sony SenSWIR InGaAs sensors for cost-effective SWIR imaging
Standard compliant USB3 and GigE Vision interfaces for straightforward integration
4-channel strobe controller supporting complex multi-light illumination scenarios
Streamlined, reliable SWIR performance with industrial-grade quality at an accessible price point

allPIXA SWIR - GigE-based Line-scan SWIR Imaging

Compact design (62 mm x 62mm x 52 mm) with C-mount lens adapter
InGaAs line-scan sensors with 512 or 1024 pixels (25μm or 12.5μm pixel size)
Line rates of up to 40 kHz for high throughput
GigE Vision compliant interface
Comprehensive on-board image correction features including DSNU, PRNU, and LUT/Gamma
Horizontal binning to increase responsivity in challenging lighting conditions
Frequency converter for flexible external line triggering
Turnkey line-scan SWIR solution with integrated image corrections, dual resolution options, and standard GigE connectivity

	Goldeye Pro	Goldeye	FXO	Alvium	EXO	AllPIXA
Best for	Best Image Quality	Scientific / Extended Range	High-speed	OEM, embedded Vision	Cost-sensitive	Line-scan
Sensor Cooling	TEC1 (20°C)	TEC1 (20°C), TEC2 (30^C)	Optional TEC1 (30°C)	None	None	N/A
Form Factor
Interfaces
Max. Resolution
Special Features

Quick Pick

If your top priority is:

Embedded tool modules, space‑constrained heads, or cost‑sensitive OEM designs
-> Choose Alvium SWIR for smallest SWaP+C and fast integration.

General inline inspection on standard vision networks (GigE/USB3)
-> Choose EXO SWIR for uniformity correction, robust I/O, and broad compatibility.

High‑speed or latency‑sensitive stations (fast conveyors, web/film, rapid sorting):
-> Choose FXO SWIR for 10GigE/CXP‑12 throughput and on‑camera 4‑channel strobe control.
Metrology, R&D, failure analysis, and long‑exposure measurements
-> Choose Goldeye SWIR for lowest noise, high linearity, and TEC/TEC2 cooling.

Machine Vision Software libraries for typical applications

eVision is a set of hardware-independent image processing and analysis libraries for machine vision inspection applications. Our Machine Vision Software is compatible with any image source, including frame grabbers, GigE Vision, and USB3 Vision cameras. The general-purpose libraries cover SWIR applications such as:

Matching and Measurement

EasyFind: Geometric pattern matching
EasyGauge: Sub-pixel measurement & dimension control
EasyMatch: Pattern matching using normalized correlation

Surface Inspection of Faint Defects

EasySpotDetector: Detection of faint defects and contamination

Deep Learning Libraries

EasySegment: Defect detection and segmentation
EasyLocate: Localization and identification of objects, products, or defects in the image
EasyClassify: Classify images after learning/training process

More than components. One source for your entire vision system.

Allied Vision brings together high-performance cameras, frame grabbers, network interface card, cables, software, and services – engineered to work as one system. Not as isolated components, but as an integrated platform that reduces complexity, eliminates interface risks, and gives you a single partner accountable for performance.

Machine Vision Software

Vimba X is Allied Vision's comprehensive SDK including a Viewer, C, C++, .NET and Python APIs, and more. Thanks to the SDK you can easily integrate cameras with GigE Vision interface into any system and manage them centrally.
Vimba X Bridge for eVision gives you easy access to eVision image processing and analysis libraries and software tools.

Frame Grabber

Frame grabber set available for CoaXPress-12 and CoaXPress-6 cameras:

PCIe frame grabbers with up to 8 CoaXPress connections
Feature-rich set of up to 20 digital I/O lines
Memento Event Logging Tool
Extensive camera control functions
PoCXP (Power over CoaXPress) camera power supply

Network Interface Cards

To convert the digital data from the camera into signals that can be transmitted via network cables Allied Vision Network Interface Cards for various interfaces and ports are available.

For 1Gig, 5GigE, and 10 GigE
From 1 port to 4 port variants
USB3 NICs for 4 and 8 ports (1HC, 4HC, and 8HC)

I/O And Power Cables

You can select from various cables

to connect your camera
to power the camera
to trigger the camera or to output trigger signals from the camera using the camera inputs and outputs.

All cables have been tested with for signal integrety to provide maximum performance. They fulfill regulatory requirements, for such as electromagnetic interference and materials.

Get Support

Whether you are looking for a single component or a complete solution for your SWIR imaging inspection application in the semiconductor industry, our team will support you in finding the right solution for you.

Contact Our Experts Now!

First Name

Last Name

Email

Phone

Company

Country

Tell us about your application:

We hate spam as much as you. Please prove that you're not a spambot. What's 6+3?

TKH Company

Selected Product

Lead Source Detail

SPAM

*mandatory field

Your data will be processed in accordance with the Privacy Policy.