# eVision

> eVision 26.10.0 documentation


2026, Euresys

## Pages in this subsection

- [Applicative Processing (Discontinued)](index.html.md): Overview of eVision's applicative processing tools, currently featuring EasySpotDetector for surface inspection in battery, film, and glass industries.
- [EasySpotDetector - Detecting Spots with Deep Learning](easyspotdetector/index.html.md): Introduces EasySpotDetector, eVision's deprecated surface inspection library for detecting particles and scratches, with optional deep learning classification.
- [Using EasySpotDetector](easyspotdetector/using_easyspotdetector.html.md): Explains how to use the deprecated EasySpotDetector tool: alignment, particle and scratch detection, and optional deep learning classification.

## Optional

- [Top-level llms.txt](../../llms.txt): Complete documentation index.
